南華早報

Beijing blasts US ban on device testing in China, warns of supply chain hit

作者 Holly Chik全文約 2,938 字

文章摘要

南華早報 · 文章頁摘要

Commerce ministry urges Washington to revoke measures barring Chinese labs from certifying smartphones and computers.

Beijing blasts US ban on device testing in China, warns of supply chain hit（新聞配圖）
配圖來源：南華早報

China’s Ministry of Commerce has voiced firm opposition to a decision by the US Federal Communications Commission (FCC) to bar device testing in China...

https://www.scmp.com/news/china/diplomacy/article/3372816/beijing-blasts-us-ban-device-testing-china-warns-supply-chain-disruptions