南華早報

China’s new 0.1-nanometre electron microscope ready to challenge US and Japan

作者 Victoria Bela

文章摘要

南華早報 · 文章頁摘要

Model marks shift from R&D to commercialisation and aligns with country’s effort to cut reliance on imported tech.

China’s new 0.1-nanometre electron microscope ready to challenge US and Japan(新聞配圖)
配圖來源:南華早報

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